Nanoelectronic Device Applications Handbook

Contents

Foreword

Preface

Editors

Contributors

SECTION I

Nano-CMOS Modeling

Chapter 1    Validation of Nano-CMOS Predictive Technology Model Tool on NanoHUB.org

Alejandro Rodriguez and Hasina F. Huq

Chapter 2    Comparative Analysis of Mobility and Dopant Number Fluctuation Models for the Threshold Voltage Fluctuation Estimation in 45 nm Channel Length MOSFET Device

Nabil Ashraf, Dragica Vasileska, Gilson Wirth, and Purushothaman Srinivasan

Chapter 3    Impact of Random Interface Traps on Asymmetric Characteristic Fluctuation of 16-nm-Gate MOSFET Devices

Yiming Li

SECTION II

Nano-CMOS Technology

Chapter 4    Bottom-Up Approaches for CMOS Scaling in the Nanoscale Era

Mrunal A. Khaderbad and V. Ramgopal Rao

Chapter 5    Study of Lanthanum ...