Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

9

Small-Delay Defect Coverage Metrics

Devta-Prasanna Narendra and K. Goel Sandeep

9.1 Role of Coverage Metrics

9.2 Overview of Existing Metrics

9.2.1 Delay Test Coverage Metric

9.2.1.1 Shortcomings of the DTC Metric

9.2.2 Statistical Delay Quality Level Metric

9.2.2.1 Shortcomings of the SDQL Metric

9.3 Proposed SDD Test Coverage Metric

9.3.1 Quadratic SDD Test Coverage Metric

9.3.2 Faster-than-at-Speed Testing

9.4 Experimental Results

9.4.1 Sensitivity to System Frequency

9.4.2 Sensitivity to Defect Distribution

9.4.3 Timing-Aware versus Faster-than-at-Speed

9.5 Conclusion

References

9.1 Role of Coverage Metrics

Integrated circuits that are manufactured using advanced processes and designed to perform at high frequencies can suffer from ...