Contents
1 Mixed-Signal Integrated Systems: Limitations and Challenges
1.1 Integrated circuit design flow
1.3 Integrated system perspectives
1.4 Built-in self-test structures
2.1.1 I/V characteristics of MOS transistors
2.1.2 Drain current in the strong inversion approximation
2.1.3 Drain current in the subthreshold region
2.1.4 MOS transistor capacitances
2.1.5 Scaling effects on MOS transistors
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