The authors would like to acknowledge the peer reviewers of the manuscript for this book for their careful review and helpful comments:
Dr. Kenneth Green, LeMay professor of technology, Southern Arkansas University.
Mr. Ken Holland, continuous improvement program manager, supply chain operations, Freescale, Inc.
Mr. George Dyche, product manager, Avery Dennison Corp.
Mr. Steve Halliday, president of RAIN RFID.
Mr. Glenn Outerbridge, CEO, Cybersoft North America.
We would like to thank Mr. Scott Isenberg, Business Expert Press senior acquisitions editor, who provided us the opportunity to undertake the writing of this book, and the editorial staff at Business Expert Press, who worked with us to turn our manuscript into a finished ...
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