R3.0 Books
[Abramovici 1994] M. Abramovici, M.A. Breuer, A.D. Friedman, Digital Systems Testing and Testable Design 1994 IEEE Press Revised Printing, Piscataway, NJ
[Bardell 1987] P.H. Bardell, W.H. McAnney, J. Savir, Built-in Test for VLSI: Pseudorandom Techniques 1987 John Wiley & Sons Somerset, NJ
[Bushnell 2000] M.L. Bushnell, V.D. Agrawal, Essentials of Electronic Testing for Digital, Memory & Mixed-Signal VLSI Circuits 2000 Springer Boston
[Crouch 1999] A. Crouch, Design for Test for Digital IC's and Embedded Core Systems 1999 Prentice-Hall Englewood Cliffs, NJ
[Gizopoulos 2006] D. Gizopoulos, Advances in Electronic Testing: Challenges and Methodologies 2006 Morgan Kaufmann San Francisco
[Golomb 1982] S.W. Golomb, Shift ...
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