Test, measure, iterate: Balancing “good enough” and “perfect” in the critical path
Kris Beevers examines the trade-offs between risk and velocity faced by any high-growth, critical path technology business.
See saw (source: Antranias via Pixabay)
This is a keynote from the O’Reilly Velocity Conference in New York 2018. See other highlights from the event.
This keynote was sponsored by NS1.
