Test, measure, iterate: Balancing “good enough” and “perfect” in the critical path
Kris Beevers examines the trade-offs between risk and velocity faced by any high-growth, critical path technology business.
![See saw](https://www.oreilly.com/content/wp-content/uploads/sites/2/2020/01/operations-see-saw-crop-4a18b646420efb41fe854e7573afea4c.jpg)
This is a keynote from the O’Reilly Velocity Conference in New York 2018. See other highlights from the event.
This keynote was sponsored by NS1.